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X-ray Ptychography at the Edge: Towards Real-Time Feedback for High-Speed Nanoimaging
DescriptionX-ray ptychography is becoming an indispensable tool for nanoscale imaging, driving innovation in functional materials, electronics, life sciences, etc. To retrieve sample images, the technique relies on advanced mathematical algorithms, making it computationally intensive. Recent advances in data acquisition have greatly increased the data generation rate, making it challenging to perform reconstruction in a timely manner to support decision making during an experiment. Here, we demonstrate how efficient GPU-based iterative reconstruction algorithms, deployed at the edge, enable real-time feedback during high-speed continuous data acquisition, allowing for a more informed experiment execution and thus increasing the quality and efficiency of the measurements. These developments represent a steppingstone towards augmentation of computationally intensive experiments with data-driven decision making, paving the way for autonomous experiments performed at machine speeds.
